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Kumada, Takayuki; Miura, Daisuke*; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Suzuki, Junichi*; Oku, Takayuki; Torikai, Naoya*; Niizeki, Tomotake*
Journal of Applied Crystallography, 55(5), p.1147 - 1153, 2022/10
Times Cited Count：1 Percentile：27.54(Chemistry, Multidisciplinary)Spin-contrast-variation neutron reflectivity obtains multiple reflectivity curves from a single sample and a single beam source. We used the strong point of the technique to reveal that, although methylated-perhydropolysilazane-derived silica layer has a higher porosity near the interface with acrylic urethane resin, the resin did not permeate the pore network.
Kumada, Takayuki; Miura, Daisuke*; Akutsu, Kazuhiro*; Suzuki, Junichi*; Torikai, Naoya*
Hamon, 30(4), p.207 - 211, 2020/11
We developed a technique of spin-contrast-variation neutron reflectivity (SCV-NR) for structural analyses of multilayer films. The SCV-NR curves of the polystyrene monolayer film were precisely reproduced using a common set of structural parameters and neutron scattering length density at each proton polarization. This result ensures that SCV-NR curves are not deformed by inhomogeneous PH due to the spin-diffusion mechanism. The number of structural parameters of the lamellar microphase-separated poly(styrene-block-isoprene) thin film is too large to determine with a single unpolarized reflectivity curve only. However, these parameters converged through the global analysis of the SCV-NR curves. In this manner, SCV-NR determines the structure of multilayer films while excluding the incorrect structural model that accidentally accounts for a single unpolarized reflectivity curve only.
Takeda, Masayasu
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no abstracts in English
Takeda, Masayasu
no journal, ,
no abstracts in English
Takeda, Masayasu
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no abstracts in English
Kumada, Takayuki; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Sahara, Masae*; Suzuki, Junichi*; Torikai, Naoya*
no journal, ,
Scattering power of neutron against proton remarkably depends on relative direction of these spins. Spin contrast variation (SCV) is a technique to determine structure of composite materials from their polarized neutron scattering profiles that vary as a function of proton polarization. Very recently, we succeeded in the first SCV neutron reflectometry measurement. We determined roughness of two surfaces of a thin-film polymer from the SCV neutron reflection curves. We will use this technique to study structures of multilayered films such as coupling agents (glues) between organic and inorganic materials.
Takeda, Masayasu
no journal, ,
no abstracts in English
Takeda, Masayasu
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no abstracts in English
Kumada, Takayuki
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no abstracts in English
